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DC FieldValueLanguage
dc.contributor.authorIEEE-
dc.date.accessioned2017-07-12T15:41:48Z-
dc.date.available2017-07-12T15:41:48Z-
dc.date.issued1979-
dc.identifier.urihttp://item.bettergrids.org/handle/1001/233-
dc.description.abstractThe IEEE 24-bus reliability test system was developed by the IEEE reliability subcommittee and published in 1979 as a benchmark for testing various reliability analysis methods. The three reliability test systems are IEEE one-area, IEEE two-area, and IEEE three-area.en_US
dc.publisherTexas A&M University Engineeringen_US
dc.subjectReliabilityen_US
dc.titleIEEE 24-Bus Systemen_US
dc.title.alternativePSS/E Formaten_US
dc.typeGrid Model Dataset Referenceen_US
grid.publisher.urlhttps://electricgrids.engr.tamu.edu/en_US
grid.formatPTI-PSS-Een_US
grid.buses24en_US
grid.generators11en_US
grid.identifier.urlhttp://electricgrids.engr.tamu.edu/about-us/ieee-24-bus-system/-
Appears in Collections:Transmission Steady State



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